Influence of support material on formation of electrocatalytic thin films—a secondary ion mass spectrometry study

TitleInfluence of support material on formation of electrocatalytic thin films—a secondary ion mass spectrometry study
Publication TypeJournal Article
Year of Publication1997
AuthorsPiccirillo, C, Daolio, S, Kristóf, J, Mihály, J, Facchin, B, Fabrizio, M
JournalInternational Journal of Mass Spectrometry and Ion Processes
Volume161
Pagination141 - 149
ISSN0168-1176
KeywordsIridium dioxide
Abstract

The influence of various support materials, such as nickel and titanium, on the structure of TiO2, RuO2, RuO2/TiO2 and IrO2/TiO2 electrocatalytic thin films was investigated in detail by secondary ion mass spectrometry (SIMS). The coatings were prepared by heat treatment following literature procedure. It is shown that various support materials can favor the formation and can influence the ion yield of ionic species with different oxidation states. The penetration characteristics of TiO2 in two-component systems on the same support are influenced by the nature of the noble metal. Furthermore, changes in the structure of the coatings due to method and time of storage may be detected by SIMS analysis.

URLhttp://www.sciencedirect.com/science/article/pii/S0168117696045314
DOI10.1016/S0168-1176(96)04531-4