|Title||Fast atom beam treatment of ultra-high molecular weight polyethylene|
|Publication Type||Journal Article|
|Year of Publication||2004|
|Authors||Tóth, A, Ujvari, T, Bertóti, I, Szilagyi, E, Keszthelyi, T, Juhasz, A|
|Journal||Surface and Interface Analysis|
Ultra-high molecular weight polyethylene (UHMWPE) was surface treated by beams of various inert and reactive atoms in the low keV range. Sum frequency generation (SFG) spectroscopy showed the complete destruction of ordered packing at the topmost surface. Rutherford backscattering (RBS) and elastic recoil detection analysis (ERDA) revealed a strong surface dehydrogenation. Depth-sensing nano-indentation and nanoscratch measurements testified to alterations in the nanomechanical properties. A correlation has been established between the scratch resistance and the plasmon loss energy of the C is XPS peak. Copyright (C) 2004 John Wiley Sons, Ltd.